Method for measuring thickness of an optical disc

Details Method for measuring thickness of an optical disc Method for measuring thickness of an optical disc

2006-12-05

2006-12-05

Toatley, Jr., Gregory J. (Department: 2877)

Optics: measuring and testing

By light interference

For dimensional measurement

C356S630000

Reexamination Certificate

active

07145662

ABSTRACT:
A method of measuring thickness of an optical disc by using an interference effect of the optical disc layer is disclosed. The method includes detecting an intensity of a reflective light according to a wavelength of a light as spectrum data for each wavelength, converting the detected spectrum data for each wavelength into a spectrum value as a function of a wavelength that a refractive index is reflected, and detecting a position where the intensity of the reflective light has a peak as a thickness of a spacer layer and a cover layer respectively by converting the converted value into a length of an interference area for representing a layer thickness of the optical disc by the Fast Fourier Transform. The disclosed method has advantages for high precisely measuring thickness of an optical disc.

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