Method for estimating the optical nonlinearity of a material

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07417742

ABSTRACT:
A method estimates a nonlinearity profile of a material. The method includes providing a magnitude of a transform of a measured nonlinearity profile measured from the material. The method further includes providing an estimated phase term of the transform of the measured nonlinearity profile. The method further includes multiplying the magnitude and the estimated phase term to generate an estimated transform. The method further includes calculating an inverse transform of the estimated transform. The method further includes calculating a real component of the inverse transform to generate an estimated nonlinearity profile.

REFERENCES:
patent: 3880630 (1975-04-01), Izawa
patent: 4674824 (1987-06-01), Goodman et al.
patent: 4778236 (1988-10-01), Miyawaki
patent: 4792230 (1988-12-01), Naganuma et al.
patent: 4985178 (1991-01-01), Tam
patent: 5086239 (1992-02-01), Wang
patent: 5194918 (1993-03-01), Kino et al.
patent: 5220451 (1993-06-01), Gotoh et al.
patent: 5239407 (1993-08-01), Brueck et al.
patent: 5247601 (1993-09-01), Myers et al.
patent: 5262890 (1993-11-01), Berkovic et al.
patent: 5309532 (1994-05-01), Chang et al.
patent: 5317147 (1994-05-01), Dandliker et al.
patent: 5368782 (1994-11-01), Gotoh et al.
patent: 5420717 (1995-05-01), Tabata
patent: 5434699 (1995-07-01), Berkovic et al.
patent: 5481636 (1996-01-01), Fukuda et al.
patent: 5523840 (1996-06-01), Nishizawa et al.
patent: 5530544 (1996-06-01), Trebino et al.
patent: 5615041 (1997-03-01), Field et al.
patent: 5737116 (1998-04-01), Kadowaki et al.
patent: 5986798 (1999-11-01), Karlsson et al.
patent: 6043884 (2000-03-01), Curbelo
patent: 6456380 (2002-09-01), Naganuma
patent: 6479822 (2002-11-01), Nelson et al.
patent: 6608690 (2003-08-01), Niu et al.
patent: 6650466 (2003-11-01), Wise et al.
patent: 6728273 (2004-04-01), Perry
patent: 6856393 (2005-02-01), Ozcan et al.
patent: 7050169 (2006-05-01), Ozcan et al.
patent: 7148970 (2006-12-01), de Boer
patent: 7236246 (2007-06-01), Ozcan et al.
patent: 7236247 (2007-06-01), Ozcan et al.
patent: 7259868 (2007-08-01), Ozcan et al.
patent: 7271918 (2007-09-01), De Groot et al.
patent: 2004/0036880 (2004-02-01), Ozcan et al.
patent: 2004/0044714 (2004-03-01), Ozcan et al.
patent: 2004/0133614 (2004-07-01), Ozcan et al.
patent: 2004/0189999 (2004-09-01), De Groot et al.
patent: 2005/0073692 (2005-04-01), De Groot et al.
patent: 2005/0111002 (2005-05-01), Ozcan et al.
patent: 2006/0132783 (2006-06-01), Ozcan et al.
patent: 2006/0139645 (2006-06-01), Ozcan et al.
patent: 2007/0025432 (2007-02-01), Ozcan et al.
patent: 2007/0025638 (2007-02-01), Ozcan et al.
patent: 2007/0027689 (2007-02-01), Ozcan et al.
patent: 2007/0050162 (2007-03-01), Ozcan et al.
patent: 2007/0055466 (2007-03-01), Ozcan et al.
patent: 2007/0097380 (2007-05-01), De Groot et al.
patent: 2007/0211253 (2007-09-01), Ozcan et al.
patent: 2000-329618 (2000-11-01), None
patent: 2001-083015 (2001-03-01), None
patent: PCT/US03/26311 (2003-08-01), None
patent: PCT/US2004/039320 (2005-06-01), None
Alley, T. G., et al., “Space charge dynamics in thermally poled fused silica,”Journal of Non-Crystalline Solids, vol. 242, 1998, pp. 165-176.
Bonfrate, G., et al., “Parametric fluorescence in periodically poled silica fibers,”Applied Physics Letters, vol. 75, No. 16, Oct. 18, 1999, pp. 2356-2358.
Faccio, D., et al., “Dynamics of the second-order nonlinearity in thermally poled silica glass,”Applied Physics Letters, vol. 79, No. 17, Oct. 22, 2001, pp. 2687-2689.
Fienup, J.R., “Phase retrieval algorithms: a comparison,”Applied Optics, vol. 21, No. 15, Aug. 1, 1982, pp. 2758-2769.
Ferreira, P. J. S. G., “Interpolation and the Discrete Papoulis-Gerchberg Algorithm,”IEEE Transactions on Signal Processing, vol. 42, No. 10, Oct. 1994, pp. 2596-2606.
Fienup, J.R., “Reconstruction of an object from the modulus of its Fourier transform,”Optics Letters, vol. 3, No. 1, Jul. 1978, pp. 27-29.
Fisher, R. A., et al., “Transient analysis of Kerr-like phase conjugators using frequency-domain techniques,”Physical Review A, vol. 23, No. 6, Jun. 1981, pp. 3071-3083.
Kashyap, R., et al., Phase-matched second harmonic generation by periodic poling of fused silica,Applied Physics Letters, vol. 64, No. 11, Mar. 14, 1994, pp. 1332-1334.
Kazansky, P.G., et al., “Thermally poled silica glass: Laser induced pressure pulse probe of charge distribution,”Applied Physics Letters, vol. 68, No. 2, Jan. 8, 1996, pp. 269-271.
Liu, A. C., et al., “Advances in the measurement of the poled silica nonlinear profile,”SPIE, vol. 3542, Nov. 1998, pp. 115-119.
Maker, et al., “Effects of Dispersion and Focusing on the Production of Optical Harmonics,”Physical Review Letters, vol. 8, No. 1, Jan. 1, 1962, pp. 21-22.
Millane, R. P., “Analytic Properties of the Hartley Transform and their Implications,”Proceedings Of The IEEE, vol. 82, No. 3, Mar. 1994, pp. 413-428.
Miller, D.A.B., “Time reversal of optical pulses by four-wave mixing,”Optics Letters, vol. 5, No. 7, Jul. 1980, pp. 300-302.
Myers, R. A., et al., “Large second-order nonlinearity in poled fused silica,”Optics Letters, vol. 16, No. 22, Nov. 15, 1991, pp. 1732-1734.
Nakajima, N., “Reconstruction of a real function from its Hartley-transform intensity,”J. Opt. Soc. Am. A., vol. 5, No. 6, Jun. 1988, pp. 858-863.
Ozcan, A., et al., “A simple post-processing technique to improve the retrieval accuracy of second-order nonlinearity profiles,” Edward L. Ginzton Laboratory: Stanford University, Stanford, California 94305; © 2004 Optical Society of America, 2 pages.
Ozcan, A., et al., “Cylinder-assisted Maker-fringe Technique,”Electronics Letters, vol. 39, No. 25, 11thDec. 2003, 2 pages.
Ozcan, A., et al., “Improved Fourier transform technique to determine second-order optical nonlinearity profiles,” Edward L. Ginzton Laboratory: Stanford University, Stanford, California 94305; © 2003 Optical Society of America, 3 pages.
Ozcan, A., et al., “Improved technique to determine second-order optical nonlinearity profiles using two different samples,”Applied Physics Letters, vol. 84, No. 5, Feb. 2, 2004, pp. 681-683.
Ozcan, A., et al., “Inverse Fourier transform technique to determine second-order optical nonlinearity spatial profiles,”Applied Physics Letters, vol. 82, No. 9, Mar. 3, 2002, pp. 1362-1364.
Ozcan, A., et al., Erratum: “Inverse Fourier transform technique to determine second-order optical nonlinearity spatial profiles,”Applied Physics Letters, vol. 83, No. 8, Aug. 25, 2003, p. 1679.
Ozcan, A., et al., “Post-processing of the second-order optical nonlinearity profile of thin films,” Edward L. Ginzton Laboratory: Stanford University, Stanford, California 94305; © Optical Society of America, 2 pages.
Ozcan, A., et al., “Simplified inverse Fourier transform technique to measure optical nonlinearity profiles using reference sample,”Electronics Letters, vol. 40, No. 9, Apr. 29, 2004, 2 pages.
Peri, David, “Optical implementation of a phase retrieval algorithm,”Applied Optics, vol. 26, No. 9, May 1, 1987, pp. 1782-1785.
Pureur, D., et al., “Absolute measurement of the second-order nonlinearity profile in poled silica,”Optics Letters, vol. 23, No. 8, Apr. 15, 1998, pp. 588-590.
Quatieri, T. F, Jr., et al., “Iterative Techniques for Minimum Phase Signal Reconstruction from Phase or Magnitude,”IEEE Trans. Acoust., Speech, and Signal Processing, vol. ASSP-29, No. 6, Dec. 1981, pp. 1187-1193.
Qui, M., et al., “Double fitting of Marker fringes to characterize near-surface and bulk second-order nonlinearities in poled silica,”Applied Physics Letters, vol. 76, No. 23, Jun. 5, 2000, pp. 3346-3348.
Qui, M., et l.,Erratum:—“Double fitting of Marker fringes to characterize near-surface and bulk second-order nonlinearities in poled silica,ȁ

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for estimating the optical nonlinearity of a material does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for estimating the optical nonlinearity of a material, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for estimating the optical nonlinearity of a material will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4019997

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.