Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2006-10-03
2006-10-03
Lee, Hwa (Andrew) (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
C356S479000, C356S492000
Reexamination Certificate
active
07116429
ABSTRACT:
A method and apparatus for determining the thickness of slabs of materials using an interferometer.
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Van Phuc
Walecki Wojciech J.
Connolly Patrick
Lee Hwa (Andrew)
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