Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2007-07-03
2007-07-03
Lee, Hwa (Andrew) (Department: 2886)
Optics: measuring and testing
By light interference
For dimensional measurement
C356S485000, C356S492000
Reexamination Certificate
active
10900484
ABSTRACT:
Thermal expansion characteristics of test materials of ultra-low thermal expansion material are measured with a test beam that is split into a test material-measuring portion and an instrument-measuring portion. Both measuring portions propagate through common portions of a test arm. The test material-measuring portion encounters a test material, but the instrument-measuring portion does not. Thermal expansion characteristics of the test material are measured to high accuracy by manipulating the measures to distinguish displacements associated with the test material from displacements associated with the instrument structure.
REFERENCES:
patent: 4733967 (1988-03-01), Sommargren
patent: 5818588 (1998-10-01), Matsumoto et al.
patent: 6480286 (2002-11-01), Kubo et al.
patent: 6504615 (2003-01-01), Abe et al.
patent: 6847458 (2005-01-01), Freischlad et al.
patent: 6885459 (2005-04-01), Muller
V.G. Badami and M. Linder, “Ultra-High Accuracy Measurement of the Coefficient of Thermal Expansion for Ultra-Low Expansion Materials,” to appear in Proc. SPIE, vol. 4688, pp. 469-480, 2001.
Corning ULE Glass Catalog, 2001.
Hagy and Shirkey, Determining absolute thermal expansion of titania-silica glasses: a refined ultrasonic method, Appl. Opt., 14, 2099-2103 (1975).
Specification for Extreme Ultraviolet Lithography Mask Substrates, SEMI P37-1101, 2001.
M. Okaji, N. Yamada, K. Nara, H. Kato, “Laser interferometric dilatometer at low temperatures: application to fused silica SRM 739,”Cryogenics 35, pp. 887-891, 1995.
E.G. Wolff and S. A. Eselun, “Double Michelson interferometer for conactless thermal expansion measurements,” Proc. SPIE, vol. 193, pp. 204-208, 1979.
S.J. Bennett, An absolute interferometric dilatometer, ,, J. Phys. E: Sci. Instrum., 10, pp. 525-530, 1977.
W. Hou and T. Thalmann, Thermal expansion measurement of gauge Block Metrology, pp. 272-278, 1998.
E. G. Wolff and R. C. Savedra, “Precision Interferometric Dilatometer,” Rev. Sci. Instrum., 53 (7), pp. 1313-1319, 1985.
S.F. Jacobs, J. N. Bradford and J. W. Berthold III, “Ultraprecise Measurements of the Thermal Coefficients of Expansion,” Applied Optics, 9 (11), pp. 2477-2480, 1970.
Badami Vivek G.
Patterson Steven R.
Corning Incorporated
Lee Hwa (Andrew)
Schaeberle Timothy M.
LandOfFree
Device for high-accuracy measurement of dimensional changes does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Device for high-accuracy measurement of dimensional changes, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device for high-accuracy measurement of dimensional changes will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3816816