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System and method for electronically displaying yarn qualities

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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System and method for measuring thin film properties and analyzi

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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System and method for measuring thin film properties and...

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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System and method for measuring thin film properties and...

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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System and method for performing selected optical...

Optics: measuring and testing – By configuration comparison – With object being compared and scale superimposed
Reexamination Certificate

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System and method for simultaneously measuring lubricant thickne

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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System and method of inspecting connector coupling condition

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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System and method of three-dimensional inspection of...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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System for dimensioning objects

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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System for electronically grading yarn

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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System for evaluating thin film coatings

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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System for inspecting pin grid arrays

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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System for optically inspecting conditions of parts packaged on

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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System for testing a pattern recorded on a plate

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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System for the measurement of the cut length of moving articles

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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System for the measurement of the cut length of moving articles

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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System for the measurement of the cut length of moving articles

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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