Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent
1997-02-14
1999-02-02
Evans, F. L.
Optics: measuring and testing
By configuration comparison
With photosensitive film or plate
25055926, G01B 1104
Patent
active
058672745
ABSTRACT:
A system and process are described in which moving articles that are cut during a manufacturing process have their cut length measured with the use of an electronic light emitting scanner in combination with a light receiver. Accurate cut length measurements are obtained from mathematical processing of the light receiving information electronically gathered from the apparatus of the system.
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Abnett Kevin C.
Harris David E.
Wagstaff, Jr. Edwin B.
Evans F. L.
Harris Instrument Corporation
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