Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent
1998-05-08
2000-10-03
Pham, Hoa Q.
Optics: measuring and testing
By configuration comparison
With photosensitive film or plate
20429803, 20419213, 118665, 118688, 118696, 118708, 118712, 118713, 427 9, 427 10, G01B 1106, C23C 1454
Patent
active
061280879
ABSTRACT:
A system for evaluating the reflectance of an object (e.g., a CRT) that is coated with an anti-reflective coating material is disclosed. The quality and/or uniformity of the coating is evaluated by a reflectometer. The reflectometer is positioned relative to the object by non-contact sensors. Reflectance data gathered by the reflectometer is analyzed to determine to what extent the actual coating differs from the optimal (i.e., ideal) coating. A feedback system modifies the coating process for subsequent objects in an attempt to fine-tune the coating process and achieve optimal anti-reflective coatings.
REFERENCES:
patent: 4311725 (1982-01-01), Holland
patent: 4676647 (1987-06-01), Kikkawa et al.
patent: 4936964 (1990-06-01), Nakamura
patent: 5120966 (1992-06-01), Kondo
patent: 5154810 (1992-10-01), Kamerling et al.
patent: 5422703 (1995-06-01), Horie et al.
patent: 5489369 (1996-02-01), Bjornard et al.
patent: 5493401 (1996-02-01), Horie et al.
patent: 5507870 (1996-04-01), Siebert
patent: 5665214 (1997-09-01), Iturralde
patent: 5772861 (1998-06-01), Meredith, Jr. et al.
Bjornard Erik J.
Clayton Kelly R.
Gammans Charles C.
Meredith, Jr. William A.
Powers Kim D.
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