Cluster tool layer thickness measurement apparatus

CMP variable angle in situ sensor

Coating thickness measurement system and method of measuring a c

Computerized micromeasuring system and method therefor

Contact-free optical linear measurement device

Contactless thickness measuring apparatus and measuring method f

Contour detecting and dimension measuring apparatus

Cross-sectional area measuring machine

Depositing a material of controlled, variable thickness...

Detector pulse enhancement circuit

Determination of dimensions of tubes

Determination of refractive index and thickness of thin layers

Device and method for end-point monitoring used in the polishing

Device and method for observing and analyzing a stream of materi

Device for contact-free thickness measurement

Device for continuously measuring a transverse dimension of a th

Device for improving the accuracy of optical measuring apparatus

Device for measuring a transverse dimension of a thread-like str

Device for measuring dimensions of workpieces

Device for measuring height of object