LandOfFree - US Patents - Listing for Optics: measuring and testing,By alignment in lateral direction

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Apparatus for optically detecting a position of mark

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Patent

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Apparatus for positioning a semiconductor wafer

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Patent

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Apparatus for pre-aligning substrate preparatory to fine alignme

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Patent

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Apparatus for precisely aligning a pair of elements

Optics: measuring and testing – By alignment in lateral direction – With light detector

Patent

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Apparatus for processing a signal for aligning

Optics: measuring and testing – By alignment in lateral direction – With light detector

Patent

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Apparatus for processing a signal for alignment

Optics: measuring and testing – By alignment in lateral direction – With light detector

Patent

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Apparatus for producing an accurately aligned aperture of select

Optics: measuring and testing – By alignment in lateral direction – With light detector

Patent

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Apparatus for projecting a mask pattern on a substrate

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Patent

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Apparatus for projecting a mask pattern on a substrate

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Patent

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Apparatus for the automatic alignment of two superimposed object

Optics: measuring and testing – By alignment in lateral direction – With light detector

Patent

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Apparatus for the automatic alignment of two superimposed object

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Patent

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Apparatus for the in situ alignment of a mask and a...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Reexamination Certificate

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Apparatus for visually determining the correct soldering positio

Optics: measuring and testing – By alignment in lateral direction

Patent

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Apparatus for working aligned bores

Optics: measuring and testing – By alignment in lateral direction

Patent

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Apparatus including compensation mask to correct particle beam p

Optics: measuring and testing – By alignment in lateral direction

Patent

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Arrangement and method for calibrating optical line...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Reexamination Certificate

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Arrangement for aligning a mask and a substrate relative to each

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Patent

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Article holding apparatus and its use

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Patent

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Article of manufacture bearing a universal alignment target

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Reexamination Certificate

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Auto focus alignment and measurement system and method

Optics: measuring and testing – By alignment in lateral direction – With light detector

Patent

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