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Target design and methods for scatterometry overlay...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Target device and use thereof for aligning light beams utilizing

Optics: measuring and testing – By alignment in lateral direction
Patent

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Technique for automated alignment of semiconductor chips

Optics: measuring and testing – By alignment in lateral direction
Patent

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Time measurement device and method useful in a laser range camer

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Transfer apparatus for compensating for a transfer error

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Two stage optical alignment device and method of aligning...

Optics: measuring and testing – By alignment in lateral direction
Reexamination Certificate

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Two-dimensional imaging with line arrays

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Two-dimensional structure for determining an overlay...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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