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Wafer alignment device

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Wafer alignment sensor using a phase-shifted microlens array

Optics: measuring and testing – By alignment in lateral direction – With light detector
Reexamination Certificate

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Wafer alignment system

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Wafer alignment system using parallel imaging detection

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Wafer inspecting apparatus

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Wafer level alignment structures using subwavelength grating...

Optics: measuring and testing – By alignment in lateral direction
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Wafer notch dimension measuring apparatus

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Wafer positioning method and device, wafer process system,...

Optics: measuring and testing – By alignment in lateral direction
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Wafer positioning method and device, wafer process system,...

Optics: measuring and testing – By alignment in lateral direction
Reexamination Certificate

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Wafer pre-alignment apparatus and method

Optics: measuring and testing – By alignment in lateral direction – With light detector
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Wafer tilt compensation in zone plate alignment system

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Wafer-level testing of optical and optoelectronic chips

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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