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Calibration standard for 2-D and 3-D profilometry in the sub-nan

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Caliper method, system, and apparatus

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Cantilever and method of using same to detect features on a surf

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Cantilever and process for fabricating it

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Cantilever chip for use in scanning probe microscope

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Cantilever deflection sensor and use thereof

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Cantilever for a scanning probe microscope and a method of manuf

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Cantilever for atomic force microscope and method of manufacturi

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Cantilever for atomic force microscope and method of manufacturi

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Cantilever for scanning probe microscope

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Cantilever for scanning probe microscopy

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Cantilever for use in a scanning probe microscope

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Cantilever for use in atomic force microscope and manufacturing

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Cantilever for use with atomic force microscope and process for

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Cantilever for use with atomic force microscope and process for

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Cantilever for vertical scanning microscope and probe for...

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Cantilever having sensor system for independent measurement...

Measuring and testing – Surface and cutting edge testing – Roughness
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Cantilever probe and scanning type probe microscope utilizing th

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Cantilever stylus for use in an atomic force microscope and meth

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Cantilever tracking type scanning probe microscope

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