Cantilever for use in atomic force microscope and manufacturing

Details Cantilever for use in atomic force microscope and manufacturing Cantilever for use in atomic force microscope and manufacturing

1991-04-16

1993-03-16

Williams, Hezron E.

Measuring and testing

Surface and cutting edge testing

Roughness

250306, 250307, G01B 528, G01N 2300

Patent

active

051933853

ABSTRACT:
A cantilever for an atomic force microscope includes a diamond stylus for opposing a sample for detecting an atomic force, a stylus holding element, at least a portion of which is made of a magnetic material, holding the diamond stylus, and a lever having a secured end and a free end to which the stylus holding element is fastened for being deformed in response to an atomic force acting between the diamond stylus and the sample. A method of manufacturing a cantilever for an atomic force microscope comprises securing a rough diamond stylus to a stylus holding element, at least a portion of the element being magnetic, forming a stylus by grinding the rough diamond, magnetizing the magnetic stylus holding element, applying an adhesive to the surface of a lever, securing the stylus holding element to the lever with the adhesive therebetween with a magnetic field in the vicinity of the lever, removing the magnetic field from the lever after the adhesive has hardened, and demagnetizing the stylus holding element.

REFERENCES:
patent: 4340954 (1982-07-01), Chio et al.
patent: 4669300 (1987-06-01), Hall et al.
patent: 4724318 (1988-02-01), Binning
patent: 4837445 (1989-06-01), Nishioka et al.
patent: 4880975 (1989-11-01), Nishioka et al.
patent: 4935634 (1990-06-01), Hansma et al.
patent: 4943719 (1990-07-01), Akamine et al.
patent: 4943720 (1990-07-01), Jones
patent: 4945235 (1990-07-01), Nishioka et al.
patent: 4947042 (1990-08-01), Nishioka et al.
patent: 4998016 (1991-03-01), Nose et al.
patent: 5010249 (1991-04-01), Nishikawa
patent: 5021364 (1991-06-01), Akamine et al.
patent: 5051379 (1991-09-01), Bayer et al.
Kaneko et al., "Ion-Implanted Diamond Tip For a Scanning Tunneling Microscope", Japanese Journal of Applied Physics, vol. 29, No. 9, Sep. 1990, pp. 1854-1855.
"Atomic Force Microscope" Phys. Rev. Lett., vol. 56, No. 9, pp. 930-933, Mar. 3, 1986.
"Atomic Resolution with the Atomic Force Microscope on Conductors and Nonconductors" J. Vac. Sci. Technol. A6(2), pp. 271-274, Mar./Apr. 1988.
"Atomic Force Microscopy of Liquid-Covered Surfaces: Atomic Resolution Images" Appl. Phys. Lett. 51(7), pp. 484-486, Aug. 17, 1987.
"Atomic Resolution Atomic Force Microscopy of Graphite and the Native Oxide on Silicon" J. Vac. Sci. Technol. A6(2), pp. 287-290, Mar./Apr. 1988.
"An Atomic-Resolution Atomic-Force Microscope Implemented Using an Optical Lever" J. Appl. Phys. 65(1), pp. 164-167, Jan. 1, 1989.
Burnham, Nancy A., et al., "Probing the Surface Forces of Monolayer Films with an Atomic-Force Microscope", Physical Review Letters, Apr. 16, 1990, pp. 1931-1934.

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