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Parametric resonance in microelectromechanical structures

Measuring and testing – Surface and cutting edge testing – Roughness
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Pendulum scanner for scanning probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness
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Pentaerythritol in dry developers

Measuring and testing – Surface and cutting edge testing
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Perpendicular torsion micro-electromechanical switch

Measuring and testing – Surface and cutting edge testing – Roughness
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Phase feedback AFM and control method therefor

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Photothermal modulation for oscillating mode atomic force...

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Piezoelectric glide head

Measuring and testing – Surface and cutting edge testing – Roughness
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Piezoelectric microcantilevers and uses in atomic force...

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Planar resonant tunneling sensor and method of fabricating...

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Pneumatic roughness measurer

Measuring and testing – Surface and cutting edge testing – Roughness
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Pocket surface roughness gage

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Positioning apparatus

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Positioning apparatus and scanning probe microscope...

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Postemulsifiable dye penetrant system and method for using same

Measuring and testing – Surface and cutting edge testing
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Precision small scale force sensor

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Probe apparatus for measuring an electron state on a sample...

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Probe apparatus for measuring an electron state on a sample...

Measuring and testing – Surface and cutting edge testing – Roughness
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Probe for a scanning microscope

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Probe for a scanning microscope

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Probe for an atomic force microscope

Measuring and testing – Surface and cutting edge testing – Roughness
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