Measuring and testing – Surface and cutting edge testing – Roughness
Patent
1994-02-24
1994-10-25
Raevis, Robert
Measuring and testing
Surface and cutting edge testing
Roughness
G01B 528
Patent
active
053577876
ABSTRACT:
A cantilever for an atomic force microscope, has a probe formed by a structure at least partially including a linear needle crystal. A method of manufacturing the cantilever comprises the steps of applying adhesive to a distal end portion of a cantilever body and placing on the adhesive, in a state where the cantilever body is held substantially horizontally, a structure having the shape of at least four needle crystals combined with one another so as to bond the structure to the distal end portion of the cantilever body.
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Kado Hiroyuki
Tohda Takao
Matsushita Electric - Industrial Co., Ltd.
Raevis Robert
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