LandOfFree - US Patents - Listing for Error detection/correction and fault detection/recovery,Pulse or data error handling

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Testing method and apparatus for identifying disturbed cells...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Testing method and tester

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Testing method for devices with status flags

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Patent

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Testing method for dynamic logic keeper device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing method for permanent electrical removal of an...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing method for permanent electrical removal of an...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Testing method for permanent electrical removal of an...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing method of semiconductor memory device and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Testing methodology and apparatus for interconnects

Error detection/correction and fault detection/recovery – Pulse or data error handling – Transmission facility testing

Reexamination Certificate

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Testing methodology for embedded memories using built-in...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing methods and chips for preventing asnchronous...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing mobile wireless devices during device production

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing mobile wireless devices during device production

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing mobile wireless devices during device production

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing module, testing apparatus and testing method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Testing of a multi-gigabit transceiver

Error detection/correction and fault detection/recovery – Pulse or data error handling – Transmission facility testing

Reexamination Certificate

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Testing of a programmable device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing of circuit with plural clock domains

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing of data retention latches in circuit devices

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing of data retention latches in circuit devices

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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