Testing method for permanent electrical removal of an...

Details Testing method for permanent electrical removal of an... Testing method for permanent electrical removal of an...

2007-06-26

2007-06-26

Chung, Phung My (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C365S225700, C365S185050

Reexamination Certificate

active

11110636

ABSTRACT:
An apparatus and method of disconnecting or disabling an input/output terminal of an integrated circuit after packaging. Each input/output terminal of the integrated circuit includes a disabling device coupled thereto between the input/output terminal and the output driver of the respective input/output terminal. A DRAM module is disclosed having a plurality of partially good DRAM devices wherein the known bad input/output terminals are permanently disconnected using a disabling device, both the known good and known bad input/output terminals being coupled to conductive traces of a carrier substrate.

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