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Electronic digital logic circuitry – With test facilitating feature

Single clock source for plural scan capture chains

Electronic digital logic circuitry – With test facilitating feature

Static current testing apparatus and method for current steering

Electronic digital logic circuitry – With test facilitating feature

Structure for externally identifying an internal state of a semi

Electronic digital logic circuitry – With test facilitating feature

Switchable pull-ups and pull-downs for IDDQ testing of integrate

Electronic digital logic circuitry – With test facilitating feature

System and method for observing information transmitted...

Electronic digital logic circuitry – With test facilitating feature

System and method for testing integrated circuits connected toge

Electronic digital logic circuitry – With test facilitating feature

System on chip (SOC) and method of testing and/or debugging...

Electronic digital logic circuitry – With test facilitating feature

Systems and methods for maintaining board signal integrity

Electronic digital logic circuitry – With test facilitating feature

Test circuit for semiconductor integrated logic circuit using tr

Electronic digital logic circuitry – With test facilitating feature

Test mode circuit of semiconductor device

Electronic digital logic circuitry – With test facilitating feature

Test structures for simultaneous switching output (SSO)...

Electronic digital logic circuitry – With test facilitating feature

Testing hot carrier induced degradation to fall and rise time of

Electronic digital logic circuitry – With test facilitating feature

Tie-up and tie-down circuits with a primary input for testabilit

Electronic digital logic circuitry – With test facilitating feature

Verify scheme for a multi-level routing structure