Electronic digital logic circuitry – With test facilitating feature
Reexamination Certificate
2005-03-01
2005-03-01
Young, Brian (Department: 2819)
Electronic digital logic circuitry
With test facilitating feature
C714S727000
Reexamination Certificate
active
06861866
ABSTRACT:
A system on chip and method of testing and/or debugging the same, where the system on chip includes a plurality of circuits and a control circuit for receiving a serial-parallel mode control signal and at least one selection signal externally input from one or more of a plurality of pins and outputting an output signal depending on values of the serial-parallel mode control signal and the at least one selection signal.
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patent: 6430718 (2002-08-01), Nayak
Harness & Dickey & Pierce P.L.C.
Lauture Joseph
Samsung Electronics Co,. Ltd.
Young Brian
LandOfFree
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