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Wafer probe station having integrated guarding, Kelvin connectio

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Wafer probe station with integrated environment control enclosur

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Wafer probe with built in RF frequency conversion module

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Utility Patent

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Wafer probe with transparent loading member

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Wafer probecard interface

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer prober

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Wafer prober

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Wafer prober

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Wafer prober

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Wafer prober

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Wafer prober and a probe card to be used therewith

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Wafer prober for in-line cleaning probe card

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer probes

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Wafer probing machine

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer probing system and method of calibrating wafer probing...

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate

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Wafer probing system and method that stores reference pattern an

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Wafer probing test apparatus and method of docking the test...

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate

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Wafer probing test machine

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Wafer probing that conditions devices for flip-chip bonding

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer processing apparatuses and electronic device workpiece...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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