Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1988-07-11
1989-08-01
Karlsen, Ernest F.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324 725, 324158F, G01R 106, G01R 3102
Patent
active
048536270
ABSTRACT:
A wafer probe comprises a support member having an end region which is shaped to permit the end region to be brought into close proximity with a component under test. An amplifier is mounted on the support member at its end region. A conductive probe element is attached to the amplifier and is electrically connected to the amplifier's input terminal. A transmission line is connected to the amplifier's output terminal for transmitting signals from the amplifier to a measurement instrument.
REFERENCES:
patent: 3596228 (1971-07-01), Reed, Jr.
patent: 4099119 (1978-07-01), Goetz
patent: 4161692 (1979-07-01), Tarzwell
patent: 4574235 (1986-03-01), Kelly et al.
Picoprobe by GGB Industries; brochure from GGB Industries, Gillette, N.J.; 3 pages.
Strid et al; "A DC-12 GHz Monolithic . . . "; IEEE Transactions on Microwave Theory and Techniques; vol. MTT-30; No. 7; Jul. 1982; pp. 969-975.
Flegal Robert T.
Gleason Kimberly R.
McCamant Angus J.
Strid Eric W.
Karlsen Ernest F.
Lovell William S.
Smith-Hill John
Triquint Semiconductor, Inc.
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