Integrated circuit device having a test circuit to measure...

Details Integrated circuit device having a test circuit to measure... Integrated circuit device having a test circuit to measure...

2006-01-20

2008-09-02

Nghiem, Michael P (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S118000

Reexamination Certificate

active

07421364

ABSTRACT:
An integrated circuit device of the invention, has a memory macro which during normal operation latches an input address in response to a control pulse and generates data output corresponding to the input address, and a test control circuit22which during testing performs memory macro characteristic tests. A ring oscillator is configured by connecting a prescribed number of stages including one or more memory macro units, having a memory macro and a pulse generation circuit which during testing generates a control pulse for tests in response to an input pulse, and the test control circuit measures the oscillation frequency or period of the ring oscillator.

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