Integrated circuit with parameter measurement

Details Integrated circuit with parameter measurement Integrated circuit with parameter measurement

2006-12-05

2006-12-05

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S117000, C702S182000

Reexamination Certificate

active

07146285

ABSTRACT:
Embodiments of the present invention provide an integrated circuit. In one embodiment, the integrated circuit comprises logic blocks and a measurement circuit. The measurement circuit is configured to measure internal operating parameters of the integrated circuit to obtain operating parameter data and provide the operating parameter data for evaluation and configuration of the integrated circuit and the logic blocks.

REFERENCES:
patent: 5727208 (1998-03-01), Brown
patent: 6122131 (2000-09-01), Jeppson
patent: 6275782 (2001-08-01), Mann
patent: 6298454 (2001-10-01), Schleiss et al.
patent: 6415243 (2002-07-01), Mann
patent: 6480809 (2002-11-01), Slaight
patent: 6556938 (2003-04-01), Rohrbaugh et al.
patent: 2003/0024320 (2003-02-01), Bentley

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