Integrated circuit and the corresponding test method,...

Details Integrated circuit and the corresponding test method,... Integrated circuit and the corresponding test method,...

2011-06-21

2011-06-21

Charioui, Mohamed (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S120000

Reexamination Certificate

active

07966145

ABSTRACT:
An integrated circuit is provided, which includes at least one external input, a power supply and a plurality of elementary components, each having at least one internal input and at least one internal output. The circuit further includes at least one test unit having an AND gate, each input of which is connected to an internal output of one of the elementary components and an output of which is connected to the power supply via a resistor.

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French Search Report from French application No. FR07/01094 dated Oct. 1, 2007.
Voyiatzis et al., I., “A Concurrent Built-In Selt-Test Architecture Based on a Selt-Testing RAM”, IEEE Transactions on Reliability, Vo. 54, No. 1, pp. 69-78, Mar. 2005.

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