Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-03-14
2006-03-14
Asouad, Patrick J. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S120000, C324S763010
Reexamination Certificate
active
07013230
ABSTRACT:
An input-output circuit sending and/or receiving a signal to and/or from an electronic device includes a driver for supplying a signal to the electronic device, a comparator provided parallel to the driver for receiving a signal from the electronic device, a relaying circuit provided between the comparator the electronic device in series with the comparator and the electronic device, a first transmission line for coupling the comparator and the relaying circuit electrically and a first switch for selecting either of short or open-circuited state of the first transmission line and the electronic device, wherein the impedance of the relaying circuit is larger than the impedance of the first transmission line.
REFERENCES:
patent: 5821529 (1998-10-01), Chihara et al.
patent: 6255839 (2001-07-01), Hashimoto
patent: 6294949 (2001-09-01), Kojima et al.
patent: 6313657 (2001-11-01), Hashimoto
patent: 6329892 (2001-12-01), Wohlfarth et al.
patent: 6377065 (2002-04-01), Le et al.
patent: 6404220 (2002-06-01), Hashimoto
patent: 6445208 (2002-09-01), Sugamori
patent: 6836136 (2004-12-01), Aghaeepour
patent: 6856158 (2005-02-01), Frame et al.
patent: 6885213 (2005-04-01), Sunter
patent: 2001/0052097 (2001-12-01), Miura
patent: 2002/0036513 (2002-03-01), Hashimoto
patent: 2002/0070726 (2002-06-01), Sugamori
patent: 2002/0144202 (2002-10-01), Hapke
patent: 2003/0028832 (2003-02-01), Schaber et al.
patent: 4-42781 (1992-10-01), None
patent: 11-64436 (1999-03-01), None
patent: 11-311661 (1999-11-01), None
patent: 3052834 (2000-04-01), None
Patent Abstracts of Japan, Publication No. 11-311661 dated Nov. 9, 1999, 2 pgs.
Patent Abstracts of Japan, Publication No. 09-264934 dated Oct. 7, 1997, 2 pgs.
Patent Abstracts of Japan, Publication No. 04-42781 dated Feb. 13, 1992, 2 pgs.
Patent Abstracts of Japan, Publication No. 11-064436 dated Mar. 5, 1999, 2 pgs.
International Search Report issued in Int'l. Application No. PCT/JP02/07529; mailed Oct. 8, 2002, 3 pgs.
International Preliminary Examination Report issued in Int'l. Application No. PCT/JP02/07259; mailed Oct. 7, 2003, 6 pgs.
International Preliminary Examination Report dated Mar. 3, 2004 (9 pgs.).
Advantest Corporation
Asouad Patrick J.
Osha•Liang LLP
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