Integrated circuit tester with real time branching

Details Integrated circuit tester with real time branching Integrated circuit tester with real time branching

1999-01-15

2000-11-28

Wachsman, Hal

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

702117, 702119, 714738, 714742, G01R 31307

Patent

active

061547158

ABSTRACT:
An integrated circuit (IC) tester includes a set of digital and analog channels, each of which may be programmed to carry out a sequence of test activities at pins of an IC under test. The channels are interconnected by a trigger bus, and each channel may be programmed to respond to a detected event during a test by transmitting a particular trigger code to every other channel via the trigger bus. Each channel may be also programmed to respond to a particular trigger code arriving on the trigger bus by branching its sequence of test activities. Thus any channel detecting an event during a test can signal all other channels to immediately terminate a current sequence of test activities and branch to another set of test activities. Such a conditional branch capability enables the tester to automatically perform an "if/then" diagnostic test on an IC in which a test result detected at any point during the test determines the future course of the test.

REFERENCES:
patent: 5790411 (1998-08-01), Nelson
patent: 5838694 (1998-11-01), Illes et al.
patent: 5951705 (1999-09-01), Arkin et al.

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