Integrated circuit characterisation system and method

Details Integrated circuit characterisation system and method Integrated circuit characterisation system and method

2011-03-01

2011-03-01

Wachsman, Hal D (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S117000, C702S118000, C714S742000

Reexamination Certificate

active

07899640

ABSTRACT:
There is presented a system and method for characterizing an integrated circuit (IC) for comparison with a pre-defined system-level characteristic related to an aspect of IC operation, wherein a test procedure on the IC that invokes this aspect is executed, while at least one operational bottleneck is invoked to constrain operation of the IC to exhibit a system-level operation thereof related to the aspect. Data generated via the test procedure in response to the bottleneck is collected and the system-level operation exhibited thereby is compared for consistency with the pre-defined system-level characteristic.

REFERENCES:
patent: 2003/0200046 (2003-10-01), Corr
patent: 2006/0031792 (2006-02-01), Zavadsky et al.
patent: 2007/0256037 (2007-11-01), Zavadsky et al.

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