Indirect techniques for measuring 1/f noise

Details Indirect techniques for measuring 1/f noise Indirect techniques for measuring 1/f noise

2006-05-16

2006-05-16

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C324S605000

Reexamination Certificate

active

07047148

ABSTRACT:
The time required to measure 1/f noise for a device, such as an integrated circuit, can be shortened by applying offset to a chopper stabilized circuit and then using offset removal as a surrogate measure for 1/f noise performance.

REFERENCES:
patent: 4542354 (1985-09-01), Robinton et al.
patent: 4751628 (1988-06-01), Nollet
patent: 4790324 (1988-12-01), O'Hara et al.
patent: 6351506 (2002-02-01), Lewicki
patent: 5-235767 (1993-09-01), None

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