LandOfFree - US Patents - Listing for Active solid-state devices (e.g., transistors, solid-state diode,Test or calibration structure

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Test structure to monitor the effects of polysilicon pre-doping

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structure used to measure metal bottom coverage in...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structure with TDDB test pattern

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structures and methods for inspection of semiconductor...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structures and models for estimating the yield impact...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structures and models for estimating the yield impact...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structures for development of metal-insulator-metal...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structures for development of metal-insulator-metal...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structures for electrically detecting back end of the...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structures for identifying open contacts and methods of...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structures for monitoring gate oxide defect densities and t

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Patent

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Test structures for monitoring gate oxide defect densities...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structures for stacking dies having through-silicon vias

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structures for substrate etching

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test tray with carrier modules for a semiconductor device...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test vehicle with zig-zag structures

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test wafer and method for producing the test wafer

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Testable substrate and a testing method

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Testchip design for process analysis in sub-micron DRAM fabricat

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

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Testing for correct undercutting of an electrode during an...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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