Reducing sneak currents in virtual ground memory arrays

Reducing the effects of noise in non-volatile memories...

Reducing the effects of noise in non-volatile memories...

Reducing the effects of noise in non-volatile memories...

Reducing the effects of noise in non-volatile memories...

Reducing the impact of program disturb

Reduction of leakage current and program disturbs in flash...

Reduction of oxide stress through the use of forward biased body

Reduction of programming time in electrically programmable...

Reduction of punch-through disturb during programming of a...

Reduction of voltage stress across a gate oxide and across a...

Redundant purge for flash storage device

Reference cell circuit for split gate flash memory

Reference cell for high speed sensing in non-volatile memories

Reference cell with various load circuits compensating for...

Reference circuit for supplying a reference level for sensing in

Reference current generating circuit of multiple bit flash...

Reference current generation circuit for multiple bit flash...

Reference current generation circuit for multiple bit flash...

Reference current generator