Material defect evaluation apparatus using positron and its...

Material processing system and method

Material processing system and method

Materials analysis using backscatter electron emissions

Means for controlling operation of power sources associated with

Means for locating an ultra-precision positioning of a table

Means for locating an ultra-precision positioning of a table

Means for locking a workpiece to a beam-generating apparatus

Means for stepping X-ray receptor in direction opposite to posit

Measurement of film thickness by inelastic electron scattering

Measurement of film thickness of integrated circuits

Measurement technique for determining the width of a...

Measuring device for measuring the intensity and/or polarization

Measuring device in a scanning probe microscope

Measuring method and its apparatus

Measuring on-line tobacco rod basis weight using combined high a

Mechanical oscillator for wafer scan with spot beam

Medical radiographic apparatus

Medical radiographic apparatus

Medical radiographic apparatus and method