Method and apparatus for producing electron beam diffraction pat

Method and apparatus for scanning and measurement by...

Method and apparatus for the compensation of charges in secondar

Method and device for measuring electron diffraction of a...

Method and device for observing a specimen in a field of...

Method and device for observing a specimen in a field of...

Method and system for e-beam scanning

Method and system for e-beam scanning

Method for a plan-view transmission electron microscopy...

Method for adjusting imaging magnification and charged...

Method for analyzing the defectiveness of semiconductor device

Method for automatic analysis of electron beam diffraction patte

Method for autotuning of an electron microscope, and an electron

Method for correcting astigmatism and focusing in charged partic

Method for detecting an element in a sample

Method for detecting carrier profile

Method for detecting over-etch defects

Method for determining a profile quality grade of an...

Method for determining intracellular mineral levels

Method for determining pore characteristics in porous materials