LandOfFree - US Patents - Listing for Optics: measuring and testing

Optics: measuring and testing – Angle measuring or angular axial alignment – Apex of angle at observing or detecting station

Alignment device for a guided missile seeker

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Alignment device for an exposure system using a CCD camera

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Alignment device in an IC projection exposure apparatus

Optics: measuring and testing – By light interference – For dimensional measurement

Alignment free interferometer and alignment free method of...

Optics: measuring and testing – By light interference – For dimensional measurement

Alignment interferometer telescope apparatus and method

Optics: measuring and testing – By light interference – For dimensional measurement

Alignment interferometer telescope apparatus and method

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Alignment key and method of making the same

Optics: measuring and testing – Angle measuring or angular axial alignment – Automatic following or aligning while indicating measurement

Alignment laser for use in cross-connects

Optics: measuring and testing – Angle measuring or angular axial alignment

Alignment laser with over-flooded aperture system and dual-mode

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Alignment mark

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Alignment mark and aligning method using the same

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Alignment mark and defect inspection method

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Alignment mark and method of getting position reference for...

Optics: measuring and testing – By alignment in lateral direction – With light detector

Alignment mark detecting apparatus and method

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Alignment mark detecting optical system

Optics: measuring and testing – By alignment in lateral direction

Alignment mark system and method to improve wafer alignment...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Alignment mark, alignment apparatus and method, exposure...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Alignment mark, alignment apparatus and method, exposure...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Alignment mark, laser trimmer and semiconductor device manufactu