Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent
1994-09-06
1996-06-18
Rosenberger, Richard A.
Optics: measuring and testing
By alignment in lateral direction
With registration indicia
G01B 1100
Patent
active
055283721
ABSTRACT:
In a semiconductor device fabrication process, a so-called alignment mark or position-alignment mark, a laser trimmer are used. The position-alignment mark makes a considerable difference in amount between a vertically reflected laser beam light from the position-alignment mark and that from the background thereof to strengthen a contrast between the position-alignment mark and the background surrounding the mark, so that a signal-to-noise ratio (SN ratio) is considerably improved to enable a precise position alignment to be performed in the semiconductor device fabrication process. The position-alignment mark comprises: a position-detecting target having high reflectance; and a pair of low-reflectance regions which sandwich the position-detecting target therebetween.
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Fujitsu Limited
Hantis K. P.
Rosenberger Richard A.
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