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Apparatus and methods for detecting and correcting distortion of

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Apparatus and methods for measuring gaps while compensating for

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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Apparatus and methods for measuring intrinsic optical properties

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Apparatus and methods for providing phase controlled evanescent

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Apparatus and procedure for measuring the cross-section of a hol

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Apparatus and process for detecting the presence of gel defects

Optics: measuring and testing – By polarized light examination
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Apparatus and process for measuring gap and mismatch

Optics: measuring and testing – By polarized light examination – With light attenuation
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Apparatus and process for performing ellipsometric measurements

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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Apparatus and system for electro magnetic field measurements...

Optics: measuring and testing – By polarized light examination – With birefringent element
Reexamination Certificate

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Apparatus for aligning a reference reflector with a focal point

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Apparatus for analysis by ellipsometry, procedure for ellipsomet

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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Apparatus for analyzing multi-layer thin film stacks on...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Apparatus for analyzing multi-layer thin film stacks on...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Apparatus for analyzing multi-layer thin film stacks on...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Apparatus for analyzing multi-layer thin film stacks on...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Apparatus for and method of checking external appearance of sold

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Apparatus for and method of measuring boundary surface

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Apparatus for automatic optical property testing

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Apparatus for automatic tracking and contour measurement

Optics: measuring and testing – By polarized light examination – With light attenuation
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Apparatus for automatically taking a reading of the shape and/or

Optics: measuring and testing – By polarized light examination – With light attenuation
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