Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1996-08-21
1998-06-30
Hellner, Mark
Optics: measuring and testing
By polarized light examination
With light attenuation
356371, 356 401, G01B 1124
Patent
active
057742219
ABSTRACT:
Apparatus and methods for providing phase controlled evanescent illumination. The phase controlled evanescent illumination is useful for Imaging, metrology, and energy delivery. The light waves comprising the evanescent electromagnetic field are inhomogeneous in that their planes of equal phase are substantially perpendicular to the direction of propagation and to their planes of constant amplitude. The planes of equal phase are therefore normal to the surface to which the evanescent field is adjacent and to a sample surface illuminated by this field as well. Methods and means for dynamic or static phase shifting of inhomogeneous waves comprising the evanescent field are disclosed.
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Caufield Francis J.
Hellner Mark
Polaroid Corporation
Stecewycz Joseph
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