Optics: measuring and testing – By polarized light examination – With birefringent element
Patent
1997-09-17
1999-12-28
Turner, Samuel A.
Optics: measuring and testing
By polarized light examination
With birefringent element
356359, G01B 902
Patent
active
060089040
ABSTRACT:
Wavefront aberration-measuring apparatus are disclosed that can easily and accurately correct interference-fringe distortions arising from aberrations of an optical system in an interferometer and that can reduce wavefront aberration-measurement errors arising from such distortion. The apparatus comprise an interferometer that forms an interference fringe from a synthesis of a wavefront of light reflecting from a reference surface and a wavefront of light from a test object (such as a reflective surface or lens). The apparatus also comprises an image-pickup element for detecting the interference fringe, and an arithmetical calculator that calculates the wavefront aberration between the test object and the reference surface based on an output from the image-pickup element. Between the test object and the image-pickup element is an optical system (e.g., converging lens) that transmits a wavefront that is perpendicularly incident to a surface of the test object. An interference-fringe distortion corrector corrects the interference-fringe distortion based on a distortion aberration calculated in advance.
REFERENCES:
patent: 4917498 (1990-04-01), Geary
patent: 5033855 (1991-07-01), Matsui
patent: 5561525 (1996-10-01), Toyonaga et al.
Gemma Takashi
Ishii Mikihiko
Miyoshi Katsuya
Nikon Corporation
Turner Samuel A.
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