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System and method for azimuth angle calibration

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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System and method for compensating polarization-dependent sensit

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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System and method for compensating polarization-dependent sensit

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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System and method for controlling intensity of a beam of...

Optics: measuring and testing – By polarized light examination – With polariscopes
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System and method for directing electromagnetic beams

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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System and method for enhancing confocal reflectance images...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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System and method for image acquisition for inspection of articl

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System and method for imaging sub-surface...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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System and method for imaging through an irregular water...

Optics: measuring and testing – By polarized light examination – With polariscopes
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System and method for improving data acquisition capability in s

Optics: measuring and testing – By polarized light examination
Patent

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System and method for improving data acquisition capability in s

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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System and method for measuring polarization dependent loss

Optics: measuring and testing – By polarized light examination – With polariscopes
Patent

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System and method for measuring the angular position of a rotata

Optics: measuring and testing – By polarized light examination
Patent

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System and method for measuring the microroughness of a surface

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System and method for measuring the microroughness of a surface

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System and method for three-dimensional inspection using pattern

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System and method for three-dimensional inspection using...

Optics: measuring and testing – By polarized light examination – With light attenuation
Reexamination Certificate

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System and method of aligning a sample

Optics: measuring and testing – By polarized light examination
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System and method of applying xenon arc-lamps to provide 193...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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System and method of fluorescence polarimetry

Optics: measuring and testing – By polarized light examination – With polariscopes
Patent

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