System and method of applying xenon arc-lamps to provide 193...

Optics: measuring and testing – By polarized light examination – Of surface reflection

Reexamination Certificate

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Reexamination Certificate

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07489400

ABSTRACT:
Application of Xenon arc-lamps to provide UV/deep UV wavelengths in spectrophotometer, reflectometer, ellipsometer, polarimeter or the like systems.

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patent: 2002/0008874 (2002-01-01), Lee et al.

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