Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate
2006-08-03
2009-02-10
Pham, Hoa Q (Department: 2886)
Optics: measuring and testing
By polarized light examination
Of surface reflection
Reexamination Certificate
active
07489400
ABSTRACT:
Application of Xenon arc-lamps to provide UV/deep UV wavelengths in spectrophotometer, reflectometer, ellipsometer, polarimeter or the like systems.
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He Ping
Liphardt Martin M.
Welch James D.
J.A. Woollam Co. Inc.
Pham Hoa Q
Welch James D.
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