Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent
1998-10-19
1999-07-27
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
Of surface reflection
356382, G01B 1100
Patent
active
059299959
ABSTRACT:
Disclosed is an electromagnetic beam directing system and method which enables changing the direction of propagation of a spectroscopic beam of electromagnetic radiation while maintaining significant sensitivity of both (PSI) and (DELTA) ellipsometric parameters to changes in surfaces of monitored sample systems, while minimizing sensitivity to changes in electromagnetic beam directing means orientation.
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J.A. Woollam Co. Inc.
Pham Hoa Q.
Welch James D.
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