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Single polarizer focused-beam ellipsometer

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Single trianglular shaped optical retarder element for use in sp

Optics: measuring and testing – By polarized light examination
Patent

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Slab surface contour monitor

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Slab surface contour monitor

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Small gap measuring apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Small modulation ellipsometry

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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Small spot ellipsometer

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Small spot ellipsometer

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Small spot ellipsometer

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Small spot spectroscopic ellipsometer with refractive focusing

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Solid-state optical position determining apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Spatial filter means comprising an aperture with a non-unity...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Spatial light modulator fourier transform

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Spatial light modulator fourier transform

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Spatially precise optical treatment or measurement of...

Optics: measuring and testing – By polarized light examination – With birefringent element
Reexamination Certificate

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Speckle interferometry spatial filters or the like to achieve us

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Speckle pattern interferometer

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Spectral ellipsometer without chromatic aberrations

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Spectrophotometer, ellipsometer, polarimeter and the like...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Spectroplarimetric reflectometer

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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