Speckle pattern interferometer

Details Speckle pattern interferometer Speckle pattern interferometer

1981-01-12

1982-10-05

Corbin, John K.

Optics: measuring and testing

By polarized light examination

With birefringent element

350 9615, G01B 902

Patent

active

043525652

ABSTRACT:
A speckle pattern interferometer for use in the non-destructive testing of structures employs a laser beam which is split into reference and object beams having substantially the same optical path lengths to the screen of a sensor, such as a vidicon, where the two beams are combined. The object beam is reflected from the surface of an object under investigation, this object being vibrated periodically. The reference beam passes through an optical fiber cut to the proper length to equalize the length of the reference beam path with that of the object beam. The output of the vidicon is fed to an electronic processor where the signals are appropriately processed to provide a speckle pattern display on a monitor viewing screen.

REFERENCES:
patent: 4018531 (1977-04-01), Leendertz
patent: 4191476 (1980-03-01), Pollard
Pedersen et al., "Holographic Vibration Measurement Using a TV Speckle Interferometer with Silicon Target Vidicon", Optics Comm., vol. 12, No. 4, pp. 421-426, 12/74.
Glatzel et al., "Temperature Measurement Technique Using Fresnel Interference Technique", IBM Tech. Disclo. Bull., vol. 20, No. 11A, pp. 4571-4572, 4/78.

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