Speckle interferometry spatial filters or the like to achieve us

Optics: measuring and testing – By polarized light examination – With birefringent element

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356351, G01B 902

Patent

active

053921216

ABSTRACT:
It is an object of the present invention to provide a speckle interference apparatus capable of selecting given phase information at a speed higher than speckle interference fringe patterns with a higher precision. For a speckle interference apparatus in which a light beam from a light source is divided into plural light beams, and one of the light beams is passed through a measuring surface and the other light beam through a reference surface to be superposed respectively for the formation of speckle interference fringe patterns, there are arranged in the optical paths spatial filters having windows for sampling the area of a given phase among the speckle interference fringe patterns. Hence, with such filters, speckle interference fringe patterns of the same phase are produced.

REFERENCES:
patent: 4913547 (1990-04-01), Moran
patent: 5127731 (1992-07-01), De Groot

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