Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1997-01-09
1998-09-29
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
25055931, 25055938, G01B 1114
Patent
active
058152725
ABSTRACT:
A filter for a laser gaging system that significantly increases the accuracy of the system when measuring scattering or translucent surfaces by reducing deviations caused by skewed speckle patterns. The filter limits the field of view of the sensor to light rays originating along the detection axis of the laser gaging system, thereby reducing the effects of noise such as halos, star patterns and beat patterns. The filter can comprise a slit filter or preferably a slit filter in combination with a grated filter, such as a tandem holographic filter.
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Alignment Verification Using Holographic Correlation, Kevin G. Harding and Mark Michniewicz, SPIE vol. 954 Optical Testing and Metrology II (1988).
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