Optics: measuring and testing – By polarized light examination
Patent
1983-07-13
1985-12-24
Willis, Davis L.
Optics: measuring and testing
By polarized light examination
356400, G01B 1100
Patent
active
045602786
ABSTRACT:
A fixed-slit type photoelectric microscope comprises an irradiation system for irradiating a linear pattern with light beam, an objective for forming an image of the linear pattern, a single slit disposed at a point conjugate to the linear pattern with respect to the objective, a photoelectric conversion element for converting the light beam from the slit into an electrical signal, a rectifying circuit for rectifying an electrical signal from the photoelectric conversion element, and an indicator for visualizing the rectified signal. The irradiation system generates a pair of polarized light beams with planes of polarization orthogonal to each other and alternately illuminates the linear pattern with the pair of polarized light beams at fixed periods. For deflecting the pair of polarized light beams from the linear pattern in different directions, an optical deflecting element is provided between the linear pattern and the slit. Different portions of the slit are illuminated by the pair of polarized light beams deflected by the optical deflecting elements.
REFERENCES:
patent: 3502415 (1970-03-01), Hock
patent: 3943359 (1976-03-01), Matsumoto et al.
patent: 3990798 (1976-11-01), White
Proc. of International Conf. on Microlithography, Microcircuit Engineering '80 (1980), p. 181.
Mori Ichiro
Shinozaki Toshiaki
Koren Matthew W.
Tokyo Shibaura Denki Kabushiki Kaisha
Willis Davis L.
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