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Deviation angle self compensating substantially achromatic...

Optics: measuring and testing – By polarized light examination – With birefringent element
Reexamination Certificate

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Device and method for measuring birefringence in an optical data

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Device and method for monitoring alignment utilizing phase conju

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Device for interferometric detection of surface structures

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Device for measuring the angle of rotation or of the angular pos

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Device for observing test-piece surfaces by the speckle-shearing

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Differential ranging measurement system and method utilizing ult

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Displacement device, particularly for the photolithographic trea

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Dissimilar superimposed grating precision alignment and gap meas

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Driverless ellipsometer and ellipsometry

Optics: measuring and testing – By polarized light examination – With birefringent element
Reexamination Certificate

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Dual path interferometer with varying difference in path length

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Easy to align interferometric reference reflectors

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Ellipsometer, measurement device and method, and...

Optics: measuring and testing – By polarized light examination – With birefringent element
Reexamination Certificate

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Ellipsometer, measurement device and method, and...

Optics: measuring and testing – By polarized light examination – With birefringent element
Reexamination Certificate

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Exposure apparatus and method responsive to light beam wavelengt

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Exposure apparatus implementing priority speed setting arrangeme

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Extended-source low coherence interferometer for flatness testin

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Focus tracking system

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Focusing method for interferometer

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Full aperture interferometry for grazing incidence optics

Optics: measuring and testing – By polarized light examination – With birefringent element
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