Ellipsometer, measurement device and method, and...

Optics: measuring and testing – By polarized light examination – With birefringent element

Reexamination Certificate

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C359S494010, C359S256000

Reexamination Certificate

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11183782

ABSTRACT:
An ellipsometer includes an optical component and a detector. The optical component has two birefringent parts in optical communication via a border surface. Light incident on the border surface is split into two reflected and two transmitted components. The detector is configured to measure a property of at least three out of the four components. Based on the measured properties, a state of polarization of the incident light may be determined.

REFERENCES:
patent: 3511556 (1970-05-01), Ammann
patent: 3902782 (1975-09-01), Forman et al.
patent: 3914018 (1975-10-01), DeShazer
patent: 4158506 (1979-06-01), Collett
patent: 5440424 (1995-08-01), Wu et al.
patent: 6043887 (2000-03-01), Allard et al.
patent: 6570711 (2003-05-01), Ducellier
patent: 6794635 (2004-09-01), Kuerner
patent: 6816261 (2004-11-01), Patel et al.
patent: 2352513 (2001-01-01), None
patent: 03-167504 (1991-07-01), None
patent: 03-287104 (1991-12-01), None
patent: 05-196567 (1993-08-01), None
patent: 06-288835 (1994-10-01), None
patent: 2001-520754 (2001-10-01), None
patent: 2002-012977 (2002-02-01), None
“Polarization Patent”, http://www.instant-analysis.com/patents/polarization—patent.htm dated May 2, 2004.
Translation of Japanese Office Action in JP Appl. No. 2005-235530 Issued Jul. 13, 2007.

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