Dual path interferometer with varying difference in path length

Details Dual path interferometer with varying difference in path length Dual path interferometer with varying difference in path length

1986-10-16

1989-10-10

McGraw, Vincent P.

Optics: measuring and testing

By polarized light examination

With birefringent element

356360, G01B 902

Patent

active

048727563

ABSTRACT:
An interferometer is provided for producing an interference pattern from light such as laser light which travels along first and second optical paths and at the end of each such path there is a respective fixed mirror for directing light to a common optical path. Means are provided to vary the optical path length of light in the or each first or second optical path to produce an interference pattern in the common optical path, which means comprises a pair of parallel-plane optical flats in accordance with one embodiment of the invention, which are each rotated in an oscillating manner to produce a linearly varying optical path length during rotation. According to another aspect of the invention first detector means are provided for detecting a reference part of the interference pattern produced to derive therefrom a reference signal, and second detector means are provided for receiving the interference pattern to thereby derive signals indicative of successive parts of the interference pattern. Means are provided for comparing the reference and successive interference pattern signals to derive therefrom signals which indicate the optical path difference corresponding to the interference pattern.

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