Optics: measuring and testing – By polarized light examination – With birefringent element
Patent
1996-08-28
1998-11-17
Kim, Robert
Optics: measuring and testing
By polarized light examination
With birefringent element
356401, 355 53, 355 55, G01B 1100
Patent
active
058384430
ABSTRACT:
An exposure apparatus includes an exposure system for printing a pattern of a mask on a photosensitive substrate while moving a stage, supporting the photosensitive substrate, sequentially to exposure positions in accordance with a speed pattern having a predetermined highest speed and a predetermined maximum acceleration, and a device for changeably setting the highest speed.
REFERENCES:
patent: 5008703 (1991-04-01), Kawakami et al.
Canon Kabushiki Kaisha
Kim Robert
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