Apparatus for analyzing multi-layer thin film stacks on...

Apparatus for detecting a polarization altering substance on a s

Apparatus for detecting a polarization altering substance on a s

Apparatus for measuring film thickness

Apparatus for measuring film thickness formed on object,...

Apparatus for measuring reflectivity

Apparatus for measuring reflectivity

Apparatus for non-destructive inspection of blind holes

Apparatus for optical measurements of nitrogen concentration...

Apparatus for optical measurements of nitrogen concentration...

Apparatus for optical measurements of nitrogen concentration...

Apparatus for simultaneous measurement of two polarization...

Apparatus including a biochip for imaging of biological...

Apparatuses and method for paleocurrent direction determination

Application of intermediate wavelength band spectroscopic...

Application of spectroscopic ellipsometry to in situ real...

Application of spectroscopic ellipsometry to in-situ real...

Approach to improve ellipsometer modeling accuracy for...

Aspects of producing, directing, conditioning, impinging and...

Aspects of producing, directing, conditioning, impinging and...